Optical 3D Surface Metrology
Non-contact & areal topography
Measure form parameters, roughness, texture or microstructures as quality inspection of your surfaces: 3D topography data. Non-contact areal scanning, traceable & repeatable. Large FoV and sub-nm Z resolution!
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What surface measurement task is yours?
For characterizing precision-manufactured and functional or sophisticated surfaces in detail and 3D, it requires measurement technology that is reliable, fast and precise. Guaranteeing functionality and detecting defects at an early stage avoids unnecessary cost and increases the overall product quality and lifetime. TopMap from Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap sensor family are established optical quality inspection tools for the controls laboratory, in production environments or in-line.
Whether form parameters and step-height with large FOV, roughness and texture with sub-nm resolution - on precision mechanics, optics or microstructures - measure it with TopMap optical surface metrology!
Form, steps, roughness, optics or microstructures - measure it!
Surface texture
The surface texture or finish defines a workpiece topography regarding its roughness, waviness, and lay parameters. The particular 3D texturing of a precision surface affects its appearance, friction, corrosion resistance and more. Regarding ISO 4287, ISO 25178 or the new 3-part ISO 21920 - TopMap surface profilers acquire millions of data points for areal evaluation within just seconds.
Surface roughness
Surface roughness measurement with TopMap white-light interferometers provides millions of data points wihtin seconds, enabling repeatable and reliable roughness analysis. Ra, Rz... vs Sa Sz? Polytec offers 3D roughness profilers, both areal and line profilometry for roughness evaluation according to ISO 25178-1, -2, -3 and ISO 4287, 4288 and ISO 3274 and more. Send your sample for a free feasibility study and test how fast the areal and optical roughness analysis works.
TopMap Micro.View(+)
Micro.View® and its big brother Micro.View®+ are the next generation optical surface profilers. Focus Finder and Focus Tracker greatly enhance the ease of use. CST Continuous Scanning Technology turns 100mm travel range into full measurement range. Distinguish and document defects reliably with the Color Information mode. Quantify surface topography with sub-nm resolution and reliably characterize precision mechanics, sealing surfaces, MEMS or microstructures with excellent vertical resolution independent of the magnification.
Surface step-height
Measure step-height on precision surfaces for quality control of functional workpiece surfaces. Characterize step-height in 3D in a non-contact way with optical surface profilers. How to calculate step-height? Learn about the differences between profile- or line-based and areal-based step height measurement.
FTP Flatness thickness parallelism
The new Polytec FTP Flatness, Thickness and Parallelism measuring module represents the fast and comprehensive measurement solution for evaluating flatness, thickness and parallelism at once. The FTP measuring module for back and front measurements can become a game-changer in quality control of precision mechanics such as in the watch-making industry, for sealing surfaces, shim rings or optical components and more.
TopMap Pro.Surf+
The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.
Specify your measurement task, ask for a free sample report
Technology guide: compare pros & cons of optical surface metrology approaches
Find out more about the strengths and limitations of these four common surface measurement methods in the technology comparison, regarding vertical and lateral resolution, application sweet spots on smooth surfaces or roughness measurement, with or w/o stitching
- White-light interferometry
- Confocal microscopy
- Focus variation
- Chromatic confocal sensors
Profilers with large FOV (44x33 .. 230x 220mm) or sub-nm Z resolution?
Areas of application
- Automotive
![Optical measurement technology for automotive industry]()
Optical measurement technology for automotive industry - Microtechnology and nanotechnology
![Optical measurement solutions for microtechnology and nanotechnology]()
Optical measurement solutions for microtechnology and nanotechnology - Electronics, semiconductors and solar
![Optical measurement technology for Electronic, Semiconductor and Solar industry]()
Optical measurement technology for Electronic, Semiconductor and Solar industry - Data storage
![Surface topography in data storage technology]()
Surface topography in data storage technology - Steel, aluminum & metals
![Surface metrology solutions for steel, aluminum and metal machining processes]( "Surface metrology solutions for steel, aluminum and metal machining processes")
Surface metrology solutions for steel, aluminum and metal machining processes - Glass and transparent materials
![Surface topography analysis solutions for glass and transparent materials]( "Surface topography analysis solutions for glass and transparent materials")
Surface topography analysis solutions for glass and transparent materials - Precision engineering
![Surface metrology solutions for precision mechanics]( "Surface metrology solutions for precision mechanics")
Surface metrology solutions for precision mechanics - Biology and medicine
![Optical measurement technology solutions for Biology and Medicine]()
Optical measurement technology solutions for Biology and Medicine
Xperts inside!
Powerful surface metrology and reliable quality inspections depend on know-how, on insights and on experts. The new Micro.View® and Micro.View®+ are the next generation optical surface profilers. Focus Finder and Focus Tracker greatly enhance the ease of use under all conditions. CST Continuous Scanning Technology allows for using the entire travel range of up to 100 mm as extended measurement range. Distinguish and document defects or visual distortions with the latest color information imaging analysis. Quantify surface topography with sub-nanometer resolution and capture the finest details. This expertise results in reliable surface quality control solutions.
Environmental commitment according to ISO 14001
We at Polytec proudly announce our certification according to both ISO 14001 and ISO 9001. These certifications reflect our strong commitment to quality and to our environmental responsibility – cornerstone of our continuous improvement process. Thanks to our team and external partners for their dedicated support!