3D surface metrology - Optical profilometry

Non-contact 3D surface characterization

For characterizing precision-manufactured and functional or sophisticated surfaces in detail and 3D, it requires measurement technology that is reliable, fast and precise. Guaranteeing functionality and detecting defects at an early stage avoids unnecessary cost and increases the overall product quality and lifetime. TopMap from Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap sensor family are established optical quality inspection tools for the controls laboratory, in production environments or in-line.

Whether form parameters and step-height with large FOV, or roughness and texture with sub-nm resolution - on precision mechanics, optics or microstructures - TopMap optical surface metrology measures it!

Applications of optical surface metrology

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How to: Measurement System Analysis

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How to: Roughness evaluation according to ISO 21920

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How to: Technology comparison of optical surface metrology

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Form, steps, roughness, optics or microstructures - measure it!

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Analyzing surface texture, measuring the 3D texturing with optical profilers with large field of view

Surface texture

The surface texture or finish defines a workpiece topography regarding its roughness, waviness, and lay parameters. The particular 3D texturing of a precision surface affects its appearance, friction, corrosion resistance and more. Regarding ISO 4287, ISO 25178 or the new 3-part ISO 21920 - TopMap surface profilers acquire millions of data points for areal evaluation within just seconds.

Surface roughness masurement and measuring Ra, Rz roughness parameters

Surface roughness

Surface roughness measurement with TopMap white-light interferometers provides millions of data points wihtin seconds, enabling repeatable and reliable roughness analysis. Ra, Rz... vs Sa Sz? Polytec offers 3D roughness profilers, both areal and line profilometry for roughness evaluation according to ISO 25178-1, -2, -3 and ISO 4287, 4288 and ISO 3274 and more. Send your sample for a free feasibility study and test how fast the areal and optical roughness analysis works.

TopMap Micro.View(+)

Micro.View^® and its big brother Micro.View^®+ are the next generation optical surface profilers. Focus Finder and Focus Tracker greatly enhance the ease of use. CST Continuous Scanning Technology turns 100mm travel range into full measurement range. Distinguish and document defects reliably with the Color Information mode. Quantify surface topography with sub-nm resolution and reliably characterize precision mechanics, sealing surfaces, MEMS or microstructures with excellent vertical resolution independent of the magnification.

Measure step height, form parameter and 3D surface topography

Surface step-height

Measure step-height on precision surfaces for quality control of functional workpiece surfaces. Characterize step-height in 3D in a non-contact way with optical surface profilers. How to calculate step-height? Differences between profile- or line-based and areal-based step height measurement.

Flatness Thickness Parallelism combined direct topography measurement

FTP Flatness thickness parallelism

The new Polytec FTP Flatness, Thickness and Parallelism measuring module represents the fast and comprehensive measurement solution for evaluating flatness, thickness and parallelism at once. The FTP measuring module for back and front measurements can become a game-changer in quality control of precision mechanics such as in the watch-making industry, for sealing surfaces, shim rings or optical components and more.

TopMap Pro.Surf+ measuring form deviation and roughness

TopMap Pro.Surf+

The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.