Optical 3D surface profilers 

Optical 3D surface profilers from Polytec are innovative, high-precision and non-contact tools for characterizing the surface topography in 3D. They are based on the principle of white-light interferometry, which is also known as coherent or vertical scanning interferometry or coherence radar. Thanks to their large vertical range, nanometer resolution and areal measurement, they are perfect for contactlessly measuring the flatness, step height and parallelism of large sample structures – on almost every material.

We guarantee all newly purchased TopMap systems for 4 years from date of delivery.
We guarantee all newly purchased TopMap systems for 4 years from date of delivery.
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators

Free guide on how to: Measurement System Analysis

Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).

Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!

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info@polytec-ltd.co.uk