Reliable surface quality inspections and pass-fail analysis
The TopMap Pro.Surf quickly, reliably and precisely determines form deviation. TopMap Pro.Surf, the high-end solution, is ideal for measuring precision-made surfaces – in the metrology chamber, close to production or even right on the production line thanks to a high level of repeatability. The TopMap Pro.Surf offers the customized solution for all surface characterization requirements using parameters such as flatness, step heights and parallelism. All in all, the spatial resolution, the telecentric optics and the outstanding speed and performance cut a very impressive figure indeed.
Highlights
- Quick and precise 3D surface characterization
- Non-contact measurement principle and traceable measurement results
- Smart Surface Scanning technology and filter wheel for almost all surfaces
- Large measurement volume of 230 x 220 x 70 mm³
- Telecentric lens measures even low-lying points
- Safe sample handling thanks to a long stand-off distance
- Automatic component recognition without any need for mechanical mounting
- Easy-to-use and automatable measurement and analysis software
Measure form tolerances like flatness, waviness, step-height...
Polytec white-light interferometer allow an areal measurement instead unlike linear or tactile measurements, which is why a TopMap Pro.Surf does not overlook any details of your workpiece. By recording two million measurement points on a large 44 x 33 mm measuring area within just a matter of seconds avoid time-consuming stitching of single measurement sections. For an even larger field of view, this area can be extended to 230 x 220 mm field. With a 70 mm vertical measurement range (z axis) and at the same time an excellent vertical resolution regardless of the image field sizes, the Pro.Surf is the professional surface inspection instrument leaving plenty of freedom and flexibility for adapting to your individual measuring needs. The telecentric otpical design allows for reaching even hard-to-access areas, such as drill holes and deep-lying surfaces.
The advanced data acquisition of the high-performance surface metrology instrument Pro.Surf helps to comply with typical requirements in production environments like cycle times and the required speed for assuring a given throughput. Integrated machine vision tools such as automatic pattern recognition superbly speed up the quality assurance process in addition. Capture many samples at a time with only one shot without any need for a mechanical mounting or fixture on the large field of view. The automated pattern recognition features match and detect the sample type automatically, which again reduces the overall measurement time.
Optical Surface Metrology - See more details
Free guide on how to: Measurement System Analysis
Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).
Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!
Related products
TopMap Metro.Lab
Being a complete measuring station, the TopMap Metro.Lab is ideally suited to large-area topographies on almost all surfaces. Since it offers great value for money, it is also attractive for smaller companies with fewer tasks.
TopMap Pro.Surf+
The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.