Next generation optical surface profiler 

TopMap Micro.View+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View + delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing visualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data visualization of engineered surfaces.

Highlights

  • High-end white-light interferometer with nm resolution
  • 100 mm z measurement range with CST Continuous Scanning Technology
  • With Focus Finder and Focus Tracker ready for automation
  • Motorized X, Y, Z, tip/tilt and turret save repositioning
  • Color information mode for extended analysis and documentation of defects
  • Modular, application-specific configurations
Micro.View+ is a modular optical surface profiler for profound and detailed topography analysis
Micro.View+ is a modular optical surface profiler for profound and detailed topography analysis
TopMap Micro.View+ with automated focus tracking function
Focus Finder and Focus Tracker are ideal for automation surface inspections
Characterize small details and microstructures with sub-nanometer resolution; sample data of an optical polished surface
Characterize small details and microstructures with sub-nm resolution; sample data of an optical polished surface
High-resolution roughness measurement <1nm; sample data of a polished silicon surface
High-resolution roughness measurement <1nm; sample data of a polished silicon surface
Capture surface areas with high slopes and steep angles; sample data of a dental implant screw
Capture surface areas with high slopes and steep angles; sample data of a dental implant screw
Detailed topography analysis of wafers, lab-on-a-chip and more
Detailed topography analysis of wafers, lab-on-a-chip and more
Color information mode for extended analysis and documentation of defects
Color information mode for extended analysis and documentation of defects
Configuration scheme of the modular optical surface profiler TopMap Micro.View+
Modularity is key to comply with challenging surface topography analysis
Micro.View+ is a modular optical surface profiler for profound and detailed topography analysis
Micro.View+ is a modular optical surface profiler for profound and detailed topography analysis
TopMap Micro.View+ with automated focus tracking function
Focus Finder and Focus Tracker are ideal for automation surface inspections
Characterize small details and microstructures with sub-nanometer resolution; sample data of an optical polished surface
Characterize small details and microstructures with sub-nm resolution; sample data of an optical polished surface
High-resolution roughness measurement <1nm; sample data of a polished silicon surface
High-resolution roughness measurement <1nm; sample data of a polished silicon surface
Capture surface areas with high slopes and steep angles; sample data of a dental implant screw
Capture surface areas with high slopes and steep angles; sample data of a dental implant screw
Detailed topography analysis of wafers, lab-on-a-chip and more
Detailed topography analysis of wafers, lab-on-a-chip and more
Color information mode for extended analysis and documentation of defects
Color information mode for extended analysis and documentation of defects
Configuration scheme of the modular optical surface profiler TopMap Micro.View+
Modularity is key to comply with challenging surface topography analysis

Automation enabled and production-ready

The encoded and motorized turret secures a seamless transition between objectives. Micro.View®+ features the latest Focus Finder plus Focus Tracker, keeping the surface in focus at all circumstances. The fully motorized sample positioning stages allow for stitching and automation.

Characterize small details and microstructures in 3D, evaluate areal surface roughness Sa with sub-nm resolution and evaluate even steep angles with interferometric precision. Micro.View and Micro.View+ are surface profilers based on Coherence Scanning Technology (CSI) offering an excellent vertical resolution regardless the objective magnification. With Continuous Scanning Technology (CST), 100 mm Z-travel and an equal 100 mm vertical measuring range, up to 5 MP camera, a variety of objectives from 2.5X (0.6X!) to 111X including long working distance options and glass compensation, and preset ISO parameters including ISO 25178, ASME B46.1, ISO 4287, ISO 13565, ISO 21920... 

 

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TopMap Micro.View: Next generation optical surface profiling

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