![Surface metrology 3D Surface metrology solutions by Polytec](/fileadmin/website/corporate/image/header-surface-metrology.jpg)
Surface profilers
White-light interferometers are optical 3D surface profilers and the ideal measurement solution for inspecting functional surfaces with utmost precision and reliability. TopMap surface metrology systems measure 3D profiles, evaluating form parameters like step-height, waviness, flatness and parallelism, as well as roughness and microstructures in all environments from research laboratories, close to and in production lines.
TopMap Micro.View
TopMap Micro.View® is an easy to use and compact optical profiler. Choose Micro.View® as the cost-effective quality control solution for surface analysis of precision-engineering, for inspecting roughness, microstructures and more surface details.
TopMap Micro.View+
TopMap Micro.View®+ is the next generation optical surface profiler in a modular design to reliably measure the most challenging analysis tasks regarding surface finish and microstructures with utmost precision. Focus Finder and Focus Tracker assist in keeping samples focused at all times, with fully motorized positioning units ready for automation. Find out more!
TopMap Pro.Surf
Ideal for quick and precise 3D surface characterization. The areal measurement of the TopMap Pro.Surf ensure to not miss any details when inspecting your workpiece surface. Short measuring times and a large field-of-view characterize the TopMap Pro.Surf.
TopMap Pro.Surf+
The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.
TopMap Metro.Lab
Being a complete measuring station, the TopMap Metro.Lab is ideally suited to large-area topographies on almost all surfaces. Since it offers great value for money, it is also attractive for smaller companies with fewer tasks.
![Polytec guarantees all newly purchased TopMap surface metrology systems for 4 years from date of delivery. Polytec guarantees all newly purchased TopMap surface metrology systems for 4 years from date of delivery.](/fileadmin/_processed_/d/c/csm_topmap-family-4-year-warranty_0b3a67011f.jpg)
![In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made. In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.](/fileadmin/_processed_/6/c/csm_measurement-system-analysis-process-variation-measurement-uncertainty_0425ac912e.jpg)
![Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s) Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)](/fileadmin/_processed_/2/9/csm_measurement-system-analysis-gauge-capability-deviation_f7b109f3f8.jpg)
![To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators](/fileadmin/website/surface-metrology/image/measurement-system-analysis-average-range-method.jpg)
![In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made. In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.](/fileadmin/_processed_/6/c/csm_measurement-system-analysis-process-variation-measurement-uncertainty_0425ac912e.jpg)
![Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s) Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)](/fileadmin/_processed_/2/9/csm_measurement-system-analysis-gauge-capability-deviation_f7b109f3f8.jpg)
![To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators](/fileadmin/website/surface-metrology/image/measurement-system-analysis-average-range-method.jpg)
Free guide on how to: Measurement System Analysis
Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).
Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!