Surface topography of electronics, semiconductors & solar technology
You can ideally adapt Polytec’s versatile solutions in the semiconductor industry for your applications in the electronics and solar technology industries. In the field of software, for example, you can do so by utilizing application-specific user interfaces for the OK / NOK analysis. Polytec offers you solutions to check electronic contacts – both for analyzing the height of BGAs or “solder bumps” and for analyzing the co-planarity of IC pins. You’ll also find the right systems for packaging high-power laser diodes at Polytec.
Applications
- Die bonding
![Elektrisch leitendes Kleben in der Elektronik]()
- Flexible electronics
![Surface analysis and and quality control on flexible electronics and printed electronics]( "Surface analysis and and quality control on flexible electronics and printed electronics")
Surface analysis and and quality control on flexible electronics and printed electronics - Ball grid array (BGA)
![bump measurement on a ball grid array (BGA) as 3D profile]( "bump measurement on a ball grid array (BGA) as 3D profile")
bump measurement on a ball grid array (BGA) as 3D profile - High power laser diodes
![Inspection of flatness and step-height on high power LED]( "Inspection of flatness and step-height on high power LED")
Inspection of flatness and step-height on high power LED - Mobile devices
![Production testing of components for mobile devices using 3D optical surface metrology]( "Production testing of components for mobile devices using 3D optical surface metrology")
Production testing of components for mobile devices using 3D optical surface metrology - Pass/fail analysis
![Multi-sample pass-fail analysis in manufacturing]( "Multi-sample pass-fail analysis in manufacturing")
Multi-sample pass-fail analysis in manufacturing - Surface roughness
![Non-contact surface roughness measurement in an areal 3D profile]( "Non-contact surface roughness measurement in an areal 3D profile")
Non-contact surface roughness measurement in an areal 3D profile - Layer thickness
![Optical and areal step edge test showing a 75.2 nm thick coating]( "Optical and areal step edge test showing a 75.2 nm thick coating")
Optical and areal step edge test showing a 75.2 nm thick coating - Surface flatness
![Surface flatness measurement and parallellism as form parameter]( "Surface flatness measurement and parallellism as form parameter")
Surface flatness measurement and parallellism as form parameter - Surface step-height
![Measure step height, form parameter and 3D surface topography]( "Measure step height, form parameter and 3D surface topography")
Measure step height, form parameter and 3D surface topography
