Explore cutting-edge solutions for MEMS (Micro-Electro-Mechanical Systems) testing with the precision and efficiency of laser vibrometry. This webinar will highlight advanced techniques to analyze MEMS performance, offering accurate, non-contact measurements of vibration and dynamic behavior. 

Experience unparalleled precision and efficiency in MEMS characterization with Polytec's cutting-edge solutions. The MSA-600 Micro System Analyzer delivers real-time, high-resolution dynamic response and surface topography measurements, empowering wafer-level testing with seamless probe station integration. Achieve resolution down to the picometer level, frequencies up to 8 GHz, and bandwidth up to 24 MHz, enabling rapid, quantitative measurements that streamline quality control.

For advanced applications, the MSA-650 IRIS system introduces infrared (IR) capability, allowing measurements through silicon on encapsulated devices. Effortlessly generate 3D animations of complex deflection shapes with automated scan measurements, providing deeper insights into your designs. Join us to explore how Polytec’s laser vibrometry technology is driving innovation in MEMs research, enabling precise, efficient, and repeatable device characterization for industry-leading results.