将顶部和底部地形合并在一个镜头中

工业制造部件的功能和质量依赖于良好控制和监控的加工过程。 质量控制、近线或在线质量检测通常使用表面计量学来评估形状、粗糙度和其他表面参数。 有时，对工件正反两面的综合观察对于全面的质量分析是必不可少的。

现在，Polytec 增强了有效测量结果的透视性，在单次直接测量中提供了综合的顶部和底部地形图。

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上下结合测量

FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface

有时，要进行全面的质量分析，必须对工件的正面和背面进行综合观察。 这可能需要交换或翻转样品，或使用额外的参考表面作为间接测量，或从一侧分别使用两个传感器。 每种方法都可能导致额外的测量不确定性。

新型 Polytec FTP 平面度、厚度和平行度测量模块是一次性评估平面度、厚度和平行度的快速而全面的测量解决方案。 用于背面和正面测量的 FTP 测量模块可以改变精密机械（如制表业）、密封面、垫圈或光学元件等的质量控制。

Flipping or swapping the sample for A + B topography characterization
Flipping or swapping the sample for A + B topography characterization

翻转或调换样品

在某些情况下，可以通过翻转样品来测量正反面。 这主要由旋转装置实现，需要复杂的校准程序。 Polytec 的 FTP 概念无需旋转或翻转即可进行测量，从而避免了额外的样品校准，使操作更快、更简单。

 

我们可一次完成平面度、厚度和平行度的测量

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Indirect measurement using an (imperfect) reference surface for flatness, thickness and parallelism measurement
Indirect measurement using an (imperfect) reference surface for flatness, thickness and parallelism measurement

直接测量而非间接测量

由于无法接近原始样品表面，间接测量使用参考表面来确定样品背面的特征。 这些标准程序通常会导致对工件进行耗时的连续测量。 此外，测量结果还基于参考表面完美无瑕的假设。

FTP Flatness Thickness Parallelism point or line vs areal measurement (coherence scanning interferometry)
Point or line profile reveal limited insights compared to areal measurement using coherence scanning interferometry

数据密度取决于线形或面形剖面图

普通的单点或线轮廓评估只能收集真实三维（areal）表面的有限测量点。 这就导致程序耗时，同时牺牲了更高的点密度或吞吐量。 在这里，Polytec FTP 组合测量方法提供了一种非接触式、高数据密度或在单次测量中同时从顶视图和底视图进行区域测量的方法。

Further applications

Contact your PolyXpert

+86 400 118 9805
info-cn@polytec.com