非接触式三维表面表征
如果您想对精密制造的功能表面进行详细检测，以进行过程控制和质量控制，您就需要可靠、快速和精确的测量技术。确保您的制造质量，并在早期阶段检测出缺陷，以避免增加成本。Polytec 的 TopMap 光学表面测量技术是用于非接触式形状和质量检测的创新型高精度测量技术，无论是粗糙、光滑还是闪亮的表面，也无论是任何材料。TopMap 白光干涉仪是用于测试实验室和生产的可靠质量检测工具。提供 4 年保修、强大的服务和支持，以及完整的解决方案，包括电子、光学和软件开发以及德国制造的单一来源制造。我们可以测量您的样品--发送样品并联系我们进行免费演示！
无论是大视场角的形状参数和台阶高度，还是亚纳米分辨率的粗糙度和纹理，无论是精密机械、光学还是微结构，TopMap 光学表面测量技术都能进行测量！
形状参数、台阶和高度、粗糙度和微观结构 - 测量！
纹理
表面纹理或光洁度定义了工件的粗糙度、波浪度和平面参数。精密表面的特定三维纹理会影响其外观、摩擦力、耐腐蚀性等。根据 ISO 4287、ISO 25178 或新的由三部分组成的 ISO 21920 标准，TopMap 表面轮廓仪可在数秒内获取数百万个数据点进行区域评估。
表面粗糙度测量
使用 TopMap 白光干涉仪进行的表面粗糙度测量可在数秒内提供数百万个数据点，从而实现可重复和可靠的粗糙度分析。Ra、Rz......与 Sa Sz？Polytec 提供三维粗糙度轮廓仪，可根据 ISO 25178-1、-2、-3 和 ISO 4287、4288 和 ISO 3274 等标准进行粗糙度评估的等高线和线轮廓测量。请寄送您的样品进行免费的可行性研究，并测试一下等高线和光学粗糙度分析的工作速度。
TopMap Micro.View(+)
Micro.View® and its big brother Micro.View®+ are the next generation optical surface profilers. Focus Finder and Focus Tracker greatly enhance the ease of use. CST Continuous Scanning Technology turns 100mm travel range into full measurement range. Distinguish and document defects reliably with the Color Information mode. Quantify surface topography with sub-nm resolution and reliably characterize precision mechanics, sealing surfaces, MEMS or microstructures with excellent vertical resolution independent of the magnification.
表面台阶高度
测量精密表面的阶梯高度，以控制功能工件表面的质量。使用光学表面轮廓仪以非接触方式测量三维阶梯高度。如何计算台阶高度？基于轮廓或线条的阶梯高度测量与基于等高线的阶梯高度测量之间的区别。
FTP Flatness thickness parallelism
The new Polytec FTP Flatness, Thickness and Parallelism measuring module represents the fast and comprehensive measurement solution for evaluating flatness, thickness and parallelism at once. The FTP measuring module for back and front measurements can become a game-changer in quality control of precision mechanics such as in the watch-making industry, for sealing surfaces, shim rings or optical components and more.
TopMap Pro.Surf+
Polytec 新的一体化系统。白光干涉仪的精度，加上色彩共焦传感器，足以克服一台装置上已确定的形状偏差和任意粗糙度。Pro.Surf + 用于测量大面积外形，并且在这样做时，还可以表征纳米分辨率的结构。
Specify your measurement task, ask for a free sample report
技术比较： 不同光学表面测量解决方案的优缺点
我们详细介绍了四种常见表面测量技术的优缺点。登录并阅读技术指南，了解垂直和横向分辨率的优势所在，哪种应用最适合，以及如何测量光滑闪亮的表面（如晶片、电子元件或金属）？
- 白光干涉仪
- 共焦显微镜
- 焦点变化
- 色度共焦传感器
使用大视场角（44x33 ... 230x220 毫米）或亚纳米 Z 分辨率进行表面轮廓分析？
应用领域
- 汽车
![Optical measurement technology for automotive industry]()
Optical measurement technology for automotive industry - 测量（微电子机械系统）MEMS 的动态和外形
![Optical measurement solutions for microtechnology and nanotechnology]()
Optical measurement solutions for microtechnology and nanotechnology - 电子、半导体和太阳能技术
![Optical measurement technology for Electronic, Semiconductor and Solar industry]()
Optical measurement technology for Electronic, Semiconductor and Solar industry - 硬盘驱动技术
![Surface topography in data storage technology]()
Surface topography in data storage technology - 钢、铝和金属
![Surface metrology solutions for steel, aluminum and metal machining processes]( "Surface metrology solutions for steel, aluminum and metal machining processes")
Surface metrology solutions for steel, aluminum and metal machining processes - 更加清晰的玻璃和透明材料
![Surface topography analysis solutions for glass and transparent materials]( "Surface topography analysis solutions for glass and transparent materials")
Surface topography analysis solutions for glass and transparent materials - 精密工程
![Surface metrology solutions for precision mechanics]( "Surface metrology solutions for precision mechanics")
Surface metrology solutions for precision mechanics - 生物学和医学
![Optical measurement technology solutions for Biology and Medicine]()
Optical measurement technology solutions for Biology and Medicine
Xperts inside!
Powerful surface metrology and reliable quality inspections depend on know-how, on insights and on experts. The new Micro.View® and Micro.View®+ are the next generation optical surface profilers. Focus Finder and Focus Tracker greatly enhance the ease of use under all conditions. CST Continuous Scanning Technology allows for using the entire travel range of up to 100 mm as extended measurement range. Distinguish and document defects or visual distortions with the latest color information imaging analysis. Quantify surface topography with sub-nanometer resolution and capture the finest details. This expertise results in reliable surface quality control solutions.