Highly sensitive to implants
Historically, strictly complying with a defined level of surface roughness has been the only way of inserting implants without any complications. That is why, to achieve this level of quality, it is immensely important to check the results using precise surface measurement systems after what can sometimes be a time-consuming surface treatment process. Form deviations or roughness outside of defined tolerances can be extremely unpleasant in the sensitive inner mouth area, where dental implants come into contact with both the gums and microorganisms. In certain cases, some surfaces need to be given special treatment if the desired properties are to be achieved. “Organic coatings” increase the implants’ durability. Polytec’s range of precise surface metrology products helps you to detect deviations and thereby achieve the desired surface condition.
Surface characterization on implants
Joint implants indeed are sensitive measuring examples. The only way that the body can accept the implants and not simply reject them is if they have perfect surface properties. If artificial joints have too rough a surface, the probability of undesirable microorganisms forming increases. In contrast, shortcomings in the polishing process can have a negative impact on the implants’ service life. Using TopMap surface measurement systems from Polytec is the ideal way of ensuring that you find that perfect “middle ground” every time.
Related products
TopMap Pro.Surf
Ideal for quick and precise 3D surface characterization. The areal measurement of the TopMap Pro.Surf ensure to not miss any details when inspecting your workpiece surface. Short measuring times and a large field-of-view characterize the TopMap Pro.Surf.
TopMap Micro.View
TopMap Micro.View® is an easy to use and compact optical profiler. Choose Micro.View® as the cost-effective quality control solution for surface analysis of precision-engineering, for inspecting roughness, microstructures and more surface details.
TopMap Micro.View+
TopMap Micro.View®+ is the next generation optical surface profiler in a modular design to reliably measure the most challenging analysis tasks regarding surface finish and microstructures with utmost precision. Focus Finder and Focus Tracker assist in keeping samples focused at all times, with fully motorized positioning units ready for automation. Find out more!
