Table-top optical surface profiler
TopMap Micro.View is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View measures complex topographies at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure.
Highlights
- Measure surface finish in a compact setup
- Non-contact measurement of 3D topography, roughness and texture
- 100 mm z measurement range with CST Continuous Scanning Technology
- Excellent lateral resolution
- Choose from application-specific objectives
Microscope system for surface profiling
White-light brings out the finest details of your precision engineered surfaces. Microscope objectives allow for characterizing the surface finish and quantifcation of how rough or smooth your workpiece surfaces is. Benefit from motorized surface measurements and automated positioning. The Focus Finder assists you automatically, so you can focus on your surface quality.
Small footprint with expanded capability
Benefit from the optional ECT Environmental Compensation Technology, securing reliable and accurate measurement results even in noisy and challenging production environments. Micro.View is the cost-effective quality control instrument for inspecting precision engineered surfaces in both manufacturing and research.
Free guide on how to: Measurement System Analysis
Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).
Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!
Precision measurement is about experience, about expertise and about experts and technology we trust in. Take a look behind the scenes, learn more about the development and about the people behind TopMap and meet the PolyXperts. Come join our journey!
Related products
TopMap Micro.View+
TopMap Micro.View®+ is the next generation optical surface profiler in a modular design to reliably measure the most challenging analysis tasks regarding surface finish and microstructures with utmost precision. Focus Finder and Focus Tracker assist in keeping samples focused at all times, with fully motorized positioning units ready for automation. Find out more!
TopMap Pro.Surf+
The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.
TMS Software
The TMS Software for Polytecs topography measurement systems of the TopMap series offers a wide range of features and options for quick and easy routine measurements but also for your extensive and detailed surface analysis.
Operator Interface
Especially for close-to-manufacturing applications where multiple samples are handled, the software module QC Operator Interface guides the operator and greatly simplifies quality control (QC) of precision surfaces.
TopMap QC Package
See this new package of smart features for quality control (QC) tasks! Now available for TopMap 3D surface profiling systems, supporting surface inspections especially in challenging industrial environments.