Optical 3D surface metrology solutions
Polytec offers complete solutions for quality inspections of precision engineered surfaces. Optical 3D surface profilers from Polytec are innovative, high-precision and non-contact measurement systems for characterizing entire workpiece topographies in 3D. Based on the principle of white-light interferometry, also known as coherent or vertical scanning interferometry or coherence radar, Polytec surface metrology solutions impress with a large vertical range, nanometer resolution and areal measurement with a large field of view. 3D surface metrology solutions from Polytec are ideal for reliable and reproducible measurement of surface flatness, step height and parallelism on large sample structures – on almost every material.
3D surface profilers
White-light interferometers are optical 3D surface profilers and the ideal solution for inspecting functional surfaces with utmost precision and reliability. TopMap surface metrology systems measure form parameters like step-height, waviness, flatness and parallelism, as well as roughness and microstructures in all environments from research laboratories, close to and in production lines.
Software & accessories
Learn more about our software. Our mission is to provide intuitive and efficient measurement systems. Based on this promise, we provide comprehensive measurement and analysis software for easy filtering and analysis of measured data. Use automated analysis features for routine inspections and benefit from the open software architecture for application-specific and user-configurable interfaces. Any more questions? Contact us!
Service & support
The range of PolyXpert measurement services enables anyone to characterize precision engineered surfaces with large FOV, analyze structural details with sub-nm resolution or secure process quality in manufacturing for efficient pass-fail decisions. Contact us and we'll find the best way how to benefit from cutting-edge optical measurement technology and what individual support you need at any stage - onsite or in our quality labs. Besides comissioning, calibration and repair we also offer trainings, workshops and application support. Contact our PolyXperts!
Free guide on how to: Measurement System Analysis
Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).
Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!
